Electronic device failure analysis -Impact Score, Ranking
Electronic device failure analysis ranking| Journal Rank | 26061 |
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| Impact Score | 0.06 |
|---|
| H-Index | 7 |
|---|
| SJR | 0.104 |
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About Electronic device failure analysis
Electronic device failure analysis is a reputed research journal publish the research in the field/area related to
Electrical and Electronic Engineering (Q4); Safety, Risk, Reliability and Quality (Q4). It is
published by
ASM International. The journal has an h-index of 7. The
overall rank of this journal is
26061. The more details like ISSN, Journal Quartile, SJR Score, ISSN, and other important details are provided in the following section.
Important Metrics
| Journal Title | Electronic Device Failure Analysis |
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| Publisher | ASM International |
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| ISSN | 15370755 |
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| SJR | 0.104 |
|---|
| H-Index | 7 |
|---|
| Country | United States |
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| Quartile | Q4 |
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| Online Submission | Submit |
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Electronic device failure analysis Impact Score 2024
The latest impact score of Electronic device failure analysis is 0.06.
Credit & Source: Scopus.